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TEM-compatible microdevice for the complete thermoelectric characterization of epitaxially integrated Si-based nanowires

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Nanoscale Horiz., 2024, 9,1200-1210
DOI: 10.1039/D4NH00114A, Communication
Open Access Open Access
Jose M. Sojo-Gordillo, Yashpreet Kaur, Saeko Tachikawa, Nerea Alayo, Marc Salleras, Nicolas Forrer, Luis Fonseca, Alex Morata, Albert Tarancón, Ilaria Zardo
A MEMS device for the evaluation of suspended integrated single nanowires is presented, allowing transmission and electrothermal experiments for structural and thermoelectric characterization. μ-Raman thermometry confirms nanowires' epitaxy.
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