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Atomic-level imaging of beam-sensitive COFs and MOFs by low-dose electron microscopy

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Nanoscale Horiz., 2024, 9,900-933
DOI: 10.1039/D3NH00494E, Review Article
Open Access Open Access
Zhen Zhan, Yuxin Liu, Weizhen Wang, Guangyu Du, Songhua Cai, Peng Wang
This review focuses on the mechanisms of beam damage in COFs and MOFs and evaluates various strategies to mitigate this damage using advanced low-dose TEM/STEM techniques in observing atomic defects, host–guest interactions, and surface structures.
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